Nalazite se na CroRIS probnoj okolini. Ovdje evidentirani podaci neće biti pohranjeni u Informacijskom sustavu znanosti RH. Ako je ovo greška, CroRIS produkcijskoj okolini moguće je pristupi putem poveznice www.croris.hr
izvor podataka: crosbi !

Design of two-channel FIR filterbanks with rational sampling factors using the FRM technique (CROSBI ID 508220)

Prilog sa skupa u zborniku | izvorni znanstveni rad | međunarodna recenzija

Bregović, Robert ; Saramäki, Tapio Design of two-channel FIR filterbanks with rational sampling factors using the FRM technique // Proceedings of 2005 IEEE International Symposium on Circuits and Systems. Institute of Electrical and Electronics Engineers (IEEE), 2005. str. 1098-1101-x

Podaci o odgovornosti

Bregović, Robert ; Saramäki, Tapio

engleski

Design of two-channel FIR filterbanks with rational sampling factors using the FRM technique

The design of finite-impulse response (FIR) filters is considered for generating nearly perfect-reconstruction two-channel filterbanks (FBs) with rational sampling factors. In order to ensure a good FB performance when there are significant changes in the subband signals, the filters in the FB must have very narrow transition bandwidths. This implies the use of high order FIR filters with a high arithmetic complexity. This paper shows how this complexity can be significantly reduced by properly exploiting the frequency-response masking technique when designing FIR filters in the FB. The benefits of the proposed approach are illustrated by means of an example.

Filterbanks; Rational sampling factors; Frequency masking technique

nije evidentirano

nije evidentirano

nije evidentirano

nije evidentirano

nije evidentirano

nije evidentirano

Podaci o prilogu

1098-1101-x.

2005.

objavljeno

Podaci o matičnoj publikaciji

Proceedings of 2005 IEEE International Symposium on Circuits and Systems

Institute of Electrical and Electronics Engineers (IEEE)

Podaci o skupu

2005 IEEE International Symposium on Circuits and Systems

predavanje

23.05.2005-26.05.2005

Kobe, Japan

Povezanost rada

Elektrotehnika