Nanostructure as seen by the SAXS (CROSBI ID 508207)
Prilog sa skupa u zborniku | sažetak izlaganja sa skupa
Podaci o odgovornosti
Dubček, Pavo
engleski
Nanostructure as seen by the SAXS
Small Angle X-ray scattering (SAXS) has been successfully applied on size and shape investigation of nanometer size features in different fields. With the rise of interest in nanoparticles in material science, the method is fully employed in research of wide variety of materials. Finally, the advance of thin films research with the structural features in nanometer range also shows great need for SAXS, albeit in the grazing incidence set up (GISAXS). The sensitivity of GISAXS on the surface roughness is employed in the investigation of the quality of the film growth while the thickness and the density of the film are determined precisely. The size and shape of the nanostructures, be it particles or vacancies, precipitations or agglomerations, that are present in the film are easily obtained, as well as the information about their depth distribution. The presence of nanoparticles on the film surface, or on the interface between different films in form of islands is clearly resolved. An overview of several experiments is given, ranging from mainly surface sensitive X-ray reflectivity, through strong particle scattering of dense systems, to SAXS investigation of oriented non isotropic particle buried in film
SAXS; GISAXS; thin film; quantum dots
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Podaci o prilogu
2004.
objavljeno
Podaci o matičnoj publikaciji
10th joint vacuum conference, 11th meeting of Slovenian and Croatian vacuum scientists, 24th Slovenian vacuum symposium, program and book of abstracts
Mozetič, Miran ; Šetina, Janez ; Kovač, Janez (ur.).
Ljubljana: Infokart
Podaci o skupu
10th Joint Vacuum Conference
pozvano predavanje
28.09.2004-02.10.2004
Portorož, Slovenija