engleski

GISAXS View of Vanadium Cerium Oxide Thin Films and Influence of Lithium Intercalation

Examination of structural modifications, induced by mixing vanadium and cerium oxides and by introduction of lithium in vanadium and mixed vanadium/cerium oxide films, was performed using synchrotron sourced grazing incidence small angle X-ray scattering. Samples were sol-gel derived films, deposited by dip-coating technique. Analysis of the scattering data, acquired by two-dimensional detection system, is based on the comparison of the surface and bulk characteristics of the film. The trend of estimated structural modifications is supported by the results of previous investigations on different length scale, performed by atomic force microscopy.

GISAXS; Thin films; V/Ce-oxide; Dip-coating

Objavljen na web-u: 25.10.2005.