engleski

Nanostructure of Vanadium Oxide and V/Ce Oxide Films and the Influence of Li+Intercalation

Vanadium oxide and new V/Ce oxide films on glass substrate were obtained by sol-gel process. The morphology of these nanostructured and porous films was studied by grazing-incidence small-angle X-ray scattering (GISAXS). The aim of the GISAXS study was to investigate the changes in grain sizes and porosity of vanadium oxide and V/Ce oxide at 38 and 55 at. % of V, due to the intercalation of Li+ ions. We found that the effects of the introduced Li are diverse for V and V/Ce oxides. While in the case of V oxide it resulted in both the grain size and distribution width reduction (4.3nm, half width 1nm) in the V/Ce oxide the size is increased to 3.4nm, but the distribution width is reduced to 1nm. Generally, Li introduction somehow reduces the difference in the V and V/Ce structure preferring the similar both grain sizes and the distribution widths, but also narrowing the latter. Therefore the surface contribution in V/Ce oxide is reduced, since its flatness is reduced by the presence of well defined grains. Although in a different size range, this is well supported by AFM results. V oxide surface is dominated by a grain like structure, while the surface of V/Ce oxide appears to be smooth, with the RMS surface roughness of 11 and 2 nm, respectively. In the case of the intercalated samples these values are changed to 6 and 8 nm for V and V/Ce oxide, respectively.

GISAXS; sol-gel; V and V/Ce oxides

nije evidentirano