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Microhardness of the YbAg(sub(x))In(sub(1- x))Cu(sub(4)) alloy system

We report Vickers microhardness measurements on flux grown single crystals of the YbAgxIn1-xCu4 alloy system. Although sample dependent, the microhardness exhibits clear concentration dependence: in general, it decreases with x. The lattice parameter as a function of x exhibits a similar behavior. For x < 0.5, where the lattice parameter is almost constant, the microhardness exhibits a weak enhancement. Similar concentration dependence of the lattice parameter, resistivity and microhardness allows us to conclude that the microhardness reflects the evolution of the YbAgxIn1-xCu4 alloy system towards more metallic character with increasing x.

microhardness ; single crystal YbAg(sub(x))In(sub(1-x))Cu(sub(4)) alloy system ; electronic structure

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