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Resistivity models of the phase-transformation of amorphous Al78W22 thin films under isothermal and isochronal conditions (CROSBI ID 109404)

Prilog u časopisu | izvorni znanstveni rad | međunarodna recenzija

Car, Tihomir ; Radić, Nikola ; Ivkov, Jovica ; Tonejc, Antun Resistivity models of the phase-transformation of amorphous Al78W22 thin films under isothermal and isochronal conditions // Applied physics. A, Materials science & processing, 80 (2005), -; 1087-1092-x

Podaci o odgovornosti

Car, Tihomir ; Radić, Nikola ; Ivkov, Jovica ; Tonejc, Antun

engleski

Resistivity models of the phase-transformation of amorphous Al78W22 thin films under isothermal and isochronal conditions

The phase transformation and crystallization kinetics of amorphous Al78W22 thin films under isothermal and isochronal conditions was examined by continuous in situ electrical resistance measurments. The results indicate that the crystallization mechanism is a diffusion-controlled process with a quenched-in nuclei during non-isothermal heating, whereas it is a diffusion-controlled process with a steady-state nucleation during isothermal heating.

aluminum-tungsten; thin films; phase transformation

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Podaci o izdanju

80 (-)

2005.

1087-1092-x

objavljeno

0947-8396

Povezanost rada

Fizika

Indeksiranost