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Raman Technique in Determination of Size Distribution of Oxide and Semiconductor Nanoparticles (CROSBI ID 501400)

Prilog sa skupa u zborniku | izvorni znanstveni rad | međunarodna recenzija

Ivanda, Mile (predavač) ; Furić, Krešimir ; Musić, Svetozar ; Gotić, Marijan ; Ristić, Mira ; Turković, Aleksandra ; Tonejc, Anđelka ; Djerdj, Igor ; Crnjak Orel, Zorica ; Montagna, Maurizio et al. Raman Technique in Determination of Size Distribution of Oxide and Semiconductor Nanoparticles // Proceedings of International Conference on Optoelectronics and Spectroscopy of Nano-Structured Thin films and Materials, ICOSFM 2004 / Fang, Yan (ur.). Peking: Beijing Key Lab for Nano-Photonics, 2004. str. 47-48-x

Podaci o odgovornosti

Ivanda, Mile (predavač) ; Furić, Krešimir ; Musić, Svetozar ; Gotić, Marijan ; Ristić, Mira ; Turković, Aleksandra ; Tonejc, Anđelka ; Djerdj, Igor ; Crnjak Orel, Zorica ; Montagna, Maurizio ; Ferrari, Maurizio ; Schmitt, Michael ; Babocsi, Christina ; Kiefer, Wolfgang

engleski

Raman Technique in Determination of Size Distribution of Oxide and Semiconductor Nanoparticles

This contribution reports on application of low-wavenumber Raman scattering on acoustical vibrational modes of nanoparticles. Theoretical background as well as the experimental results in determination of oxide and semiconductor particle size distribution will be presented.

Raman; Nano; Size Distribution; HRTEM

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Podaci o prilogu

47-48-x.

2004.

objavljeno

Podaci o matičnoj publikaciji

Proceedings of International Conference on Optoelectronics and Spectroscopy of Nano-Structured Thin films and Materials, ICOSFM 2004

Fang, Yan

Peking: Beijing Key Lab for Nano-Photonics

Podaci o skupu

International Conference on Optoelectronics and Spectroscopy of Nano-Structured Thin films and Materials

pozvano predavanje

02.08.2004-05.08.2004

Peking, Kina

Povezanost rada

Fizika, Kemija