engleski

Nuclear microprobe as a tool for the characterization of radiation detectors

Focused ion beams became an important tool for the characterization of semiconductor materials that are candidates for production of radiation detectors. Charge induced by single ion is usually measured in two different ways. Electronic integration of charge signals is the basis of IBIC (Ion Beam Induced Charge) technique which provides distribution of charge collection efficiency in the device under test. On the other hand, these signals can be recorded by the use of digital oscilloscope (Time Resolved IBIC - TRIBIC), revealing more details of charge transport mechanisms. By performing IBIC and TRIBIC measurements on different temperatures we have also shown that nuclear microprobe can be employed in the study of trap levels in detector material. More recently, nuclear microprobe has been also used as a tool to make microscopic structures in the detector by either ion implantation or radiation damage. Such structures may alter electric field distribution or lifetime of charge carriers in the device. Position and range sensitive particle detection is one of the possible applications that will be discussed.

nuclear microprobe; radiation detectors; IBIC

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