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Energy straggling induced errors in heavy-ion PIXE analysis (CROSBI ID 81311)

Prilog u časopisu | izvorni znanstveni rad | međunarodna recenzija

Tadić, Tonči ; Mokuno, Y. ; Horino, Y. ; Fujii, K. ; Jakšić, Milko Energy straggling induced errors in heavy-ion PIXE analysis // Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 138 (1998), 179-183

Podaci o odgovornosti

Tadić, Tonči ; Mokuno, Y. ; Horino, Y. ; Fujii, K. ; Jakšić, Milko

engleski

Energy straggling induced errors in heavy-ion PIXE analysis

Numerical calculations of the heavy-ion energy straggling influence on quantitative heavy-ion PIXE analysis are presented. Heavy ion electronic straggling was calculated using semi-empirical model of Yang. Since heavy ion nuclear straggling is significant and in some cases larger than the electronic one, it has also been included into the calculations. Energy variations of K ionization cross sections were calculated using the ECPSSRmodel. Results for heavy ions are compared with those for protons, for the case of heavy element analysis in a light matrix and for the case of light element analysis in a heavy matrix. Implications on the quantitative heavy ion PIXE analysis are discussed.

Heavy-ion. Pixe. Straggling. Ecpssr. K lines

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Podaci o izdanju

138

1998.

179-183

objavljeno

0168-583X

Povezanost rada

Fizika

Indeksiranost