Nalazite se na CroRIS probnoj okolini. Ovdje evidentirani podaci neće biti pohranjeni u Informacijskom sustavu znanosti RH. Ako je ovo greška, CroRIS produkcijskoj okolini moguće je pristupi putem poveznice www.croris.hr
izvor podataka: crosbi

Transmission electron microscopy studies of nanostructured TiO2 films on different substrates (CROSBI ID 497914)

Prilog sa skupa u zborniku | sažetak izlaganja sa skupa | međunarodna recenzija

Djerdj, Igor ; Tonejc, Anđelka ; Bijelić, Mirjana ; Vraneša, Vladimir ; Turković, Aleksandra Transmission electron microscopy studies of nanostructured TiO2 films on different substrates // 10th Joint Vacuum Conference and 11th Meeting of Slovenian and Croatian vacuum scientists and 24th Slovenian Vacuum Symposium : program and book of abstracts / Mozetč, Miran ; Šetina, Janez ; Kovač, Janez (ur.). Ljubljana: Infokart, 2004. str. 68-68

Podaci o odgovornosti

Djerdj, Igor ; Tonejc, Anđelka ; Bijelić, Mirjana ; Vraneša, Vladimir ; Turković, Aleksandra

engleski

Transmission electron microscopy studies of nanostructured TiO2 films on different substrates

A chemical vapour deposition (CVD) synthetic route to nanocrystalline titanium dioxide has been carefully investigated on different substrates. CVD was performed at low temperatures of 320 0C onto KCl crystal, Al foil, KBr pellet and freshly sliced mica. Films of approximately 1 mm thickness were obtained from 1M solution of TiCl4 in dichloromethane (Aldrich). Influence of the substrate to the crystallographic orientation and morphology of the films, regarding the substrate was studied by analytical electron microscopy techniques including bright-field (BF), dark-field (DF), selected area electron diffraction (SAED), high-resolution transmission electron microscopy (HRTEM) and energy dispersive spectroscopy (EDS). Investigations were carried out by using a JEOL JEM 2010 200 kV and a Morgagni FP 5005 microscope. Bright-field (BF) images of TiO2 samples prepared on different substrates obtained by Morgagni microscope have shown a large number of grains which are differently oriented regarding incoming electron beam and indicated different morphology of each sample. The difference in morphology regarding different substrate was confirmed by JEOL microscope. The average grain sizes were determined from DF images of HRTEM. Table I is showing that different substrates influenced average grain sizes of nanostructured films. The average grain sizes are increasing as the substrate changed from KCl to Al to KBr and finally to mica. The nano-grains in TiO2 films deposited onto KCl crystal, KBr pellet and freshly sliced mica are of irregular shape, while they are spherical in the film deposited onto Al foil.

titanium dioxide; aaverage grain size; chemical vapour deposition; transmission electron microscopy; rietveld refinement

nije evidentirano

nije evidentirano

nije evidentirano

nije evidentirano

nije evidentirano

nije evidentirano

Podaci o prilogu

68-68.

2004.

objavljeno

Podaci o matičnoj publikaciji

10th Joint Vacuum Conference and 11th Meeting of Slovenian and Croatian vacuum scientists and 24th Slovenian Vacuum Symposium : program and book of abstracts

Mozetč, Miran ; Šetina, Janez ; Kovač, Janez

Ljubljana: Infokart

Podaci o skupu

Joint Vacuum Conference (10 ; 2004) ; 11th Meeting of Slovenian and Croatian vacuum scientists (11 ; 2004) ; Slovenian Vacuum Symposium (24 ; 2004)

poster

28.09.2004-02.10.2004

Portorož, Slovenija

Povezanost rada

Fizika