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Investigation of the Extrinsic Base Effect on High Frequency Performance of Lateral Bipolar Transistor (LBT) with Laterally Contacted Base (CROSBI ID 495075)

Prilog sa skupa u zborniku | izvorni znanstveni rad | međunarodna recenzija

Koričić, Marko ; Suligoj, Tomislav ; Biljanović, Petar Investigation of the Extrinsic Base Effect on High Frequency Performance of Lateral Bipolar Transistor (LBT) with Laterally Contacted Base // The Proceedings of the MIDEM 2003 Conference / Pignatel, Giorgio ; Žemva, Andrej ; Šorli, Iztok (ur.). Ljubljana: Society for Microelectronics, Electronic Components and Materials (MIDEM), 2003. str. 207-212

Podaci o odgovornosti

Koričić, Marko ; Suligoj, Tomislav ; Biljanović, Petar

engleski

Investigation of the Extrinsic Base Effect on High Frequency Performance of Lateral Bipolar Transistor (LBT) with Laterally Contacted Base

The extrinsic base in LBTs influences high frequency performance by decreasing the effective collector cross-section, increasing collector current density and increasing the effective transit time through the base – collector depletion region. These effects are examined on structure with laterally contacted base. Influence of the technological parameters, such as extrinsic base width, emitter width and link-base length, on fT and fmax are examined and optimization and scaling scheme for this structure is proposed. This work shows that link-base region should not be scaled down as much as possible, since fT is sacrificed to obtain higher fmax.

lateral bipolar transistor ; extrinsic base effect

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Podaci o prilogu

207-212.

2003.

objavljeno

Podaci o matičnoj publikaciji

The Proceedings of the MIDEM 2003 Conference

Pignatel, Giorgio ; Žemva, Andrej ; Šorli, Iztok

Ljubljana: Society for Microelectronics, Electronic Components and Materials (MIDEM)

Podaci o skupu

39th International Conference on Microelectronics, Devices and Materials, MIDEM 2003

predavanje

01.10.2003-03.10.2003

Ptuj, Slovenija

Povezanost rada

Elektrotehnika