engleski

Small angle X-ray scattering studies of nanophase TiO_2 thin films at ELETTRA

Nanosized TiO2 thin films on curved glass substrate of thickness ranging from 1 to 7 micrometer were prepared using sol-gel and P25 paste procedure. SAXS measurements at the ELETTRA synchrotron revealed that crystallite size increased in average particle radii values <R> from 2.5 nm to 10.0 nm with annealing temperature from room temperature to 900 C. Thermal annealing was performed in atmospheres of H2, O2 and N2. The average particle radii varied differently between the two different types of preparation. The specific surface area of these films was also determined and generally varied from 106 to 108 cm-1.

TiO_2; average particle radii; thermal annealing; specific surface area; SAXS

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