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Small angle X-ray scattering study of TiO2 thin films at grazing angles (CROSBI ID 466561)

Prilog sa skupa u zborniku | sažetak izlaganja sa skupa | međunarodna recenzija

Dubček, Pavo ; Turković, Aleksandra ; Etlinger, Božidar ; Lučić-Lavčević, Magdy ; Milat, Ognjen ; Bernstorff, Sigfrid ; Amenitsch, Heinz Small angle X-ray scattering study of TiO2 thin films at grazing angles // ECM-18, Book of abstracts / Kuzel, R. ; Lhotka, J. ; Dobiasova, L. (ur.). ECS, 1998. str. 240-x

Podaci o odgovornosti

Dubček, Pavo ; Turković, Aleksandra ; Etlinger, Božidar ; Lučić-Lavčević, Magdy ; Milat, Ognjen ; Bernstorff, Sigfrid ; Amenitsch, Heinz

engleski

Small angle X-ray scattering study of TiO2 thin films at grazing angles

Nanocrystalline TiO2 thin films, deposited on the flat glass substrate using various techniques, have been investigated by GISAXS. In data interpretation it is assumed that the surface roughness correspond to the bulk structure of the film, which is porous. Therefore, both contributions should indicate the same average particle sizes and film porosity. So obtained film parameters are correlated to photo cell efficiency.

thin films; GISAXS; porosity; particle size; photo cell

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Podaci o prilogu

240-x.

1998.

objavljeno

Podaci o matičnoj publikaciji

ECM-18, Book of abstracts

Kuzel, R. ; Lhotka, J. ; Dobiasova, L.

ECS

Podaci o skupu

18th European Crystallographic Meeting

poster

15.08.1998-20.08.1998

Prag, Češka Republika

Povezanost rada

Kemijsko inženjerstvo