Small angle X-ray scattering study of TiO2 thin films at grazing angles (CROSBI ID 466561)
Prilog sa skupa u zborniku | sažetak izlaganja sa skupa | međunarodna recenzija
Podaci o odgovornosti
Dubček, Pavo ; Turković, Aleksandra ; Etlinger, Božidar ; Lučić-Lavčević, Magdy ; Milat, Ognjen ; Bernstorff, Sigfrid ; Amenitsch, Heinz
engleski
Small angle X-ray scattering study of TiO2 thin films at grazing angles
Nanocrystalline TiO2 thin films, deposited on the flat glass substrate using various techniques, have been investigated by GISAXS. In data interpretation it is assumed that the surface roughness correspond to the bulk structure of the film, which is porous. Therefore, both contributions should indicate the same average particle sizes and film porosity. So obtained film parameters are correlated to photo cell efficiency.
thin films; GISAXS; porosity; particle size; photo cell
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Podaci o prilogu
240-x.
1998.
objavljeno
Podaci o matičnoj publikaciji
ECM-18, Book of abstracts
Kuzel, R. ; Lhotka, J. ; Dobiasova, L.
ECS
Podaci o skupu
18th European Crystallographic Meeting
poster
15.08.1998-20.08.1998
Prag, Češka Republika