Improving the accuracy of alpha particle induced X-ray emission analysis: The role of multiple ionization K X-ray satellites (CROSBI ID 323642)
Prilog u časopisu | izvorni znanstveni rad | međunarodna recenzija
Podaci o odgovornosti
Cureatz, Daniel J.T. ; Kavčič, Matjaž ; Petric, Marko ; Isaković, Kristina ; Mihalić, Iva Božičević ; Ramos, Mauricio Rodriguez ; Fazinić, Stjepko ; Campbell, John L.
engleski
Improving the accuracy of alpha particle induced X-ray emission analysis: The role of multiple ionization K X-ray satellites
Wavelength-dispersive X-ray spectrometry is used to examine the influence of multiple ionization satellites induced by 3–5 MeV energy helium ion beams upon the accuracy of particle-induced X-ray emission analysis (PIXE). The work extends our prior study of elements magnesium, aluminum and silicon and their oxides to elements phosphorus, chlorine, potassium, calcium, titanium and chromium and, for the latter two, their oxides. Fitting of the spectra with Voigtian peaks enables construction of a database that comprises the mean energies and the relative intensities of up to four distinct satellite groupings. This database provides an empirical means for inclusion of one peak per satellite group when modelling energy-dispersive spectra. This is a useful step towards improving the accuracy of PIXE analysis of materials using helium beams ; an example of this is provided using a spectrum recorded by the Curiosity rover on Mars.
X-ray emission spectroscopy ; PIXE analysis ; Helium ion beams ; Multiple ionization satellites ; Distortion of EDX spectra
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Podaci o izdanju
194
2022.
106483
10
objavljeno
0584-8547
10.1016/j.sab.2022.106483
Povezanost rada
Fizika, Interdisciplinarne prirodne znanosti