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Properties of SiC and Si3N4 Thin Films Containing Self-Assembled Gold Nanoparticles (CROSBI ID 314545)

Prilog u časopisu | izvorni znanstveni rad | međunarodna recenzija

Isaković, Senad ; Đekić, Maja ; Tkalčević, Marija ; Boršćak, Denis ; Periša, Ivana ; Bernstorff, Sigrid ; Mičetić, Maja Properties of SiC and Si3N4 Thin Films Containing Self-Assembled Gold Nanoparticles // Crystals, 12 (2022), 10; 1361, 13. doi: 10.3390/cryst12101361

Podaci o odgovornosti

Isaković, Senad ; Đekić, Maja ; Tkalčević, Marija ; Boršćak, Denis ; Periša, Ivana ; Bernstorff, Sigrid ; Mičetić, Maja

engleski

Properties of SiC and Si3N4 Thin Films Containing Self-Assembled Gold Nanoparticles

The properties of semiconductor materials can be strongly affected by the addition of metallic nanoparticles. Here we investigate the properties of SiC+Au and Si3N4+Au thin films prepared by magnetron sputtering deposition followed by thermal annealing. The influence of gold addition on the optical and electrical properties is explored. We show the formation of self-assembled Au nanoparticles in SiC and Si3N4, with the size and arrangement properties determined by the deposition and annealing conditions. Both SiC- and Si3N4-based films show an increase in the overall absorption with increasing Au content, and its decrease with increasing annealing temperature. All films show the presence of surface plasmon resonance, whose peaks shift toward larger wavelengths with increasing Au nanoparticle size. The resistivity significantly drops with the Au content increase for both types of matrices, although the resistivity of Si3N4-based films is much higher. The incorporated quantity of Au in the host matrix was chosen in such a way to demonstrate that a huge range of optical and electrical characteristics is achievable. The materials are very interesting for application in opto-electronic devices.

SiC ; Si3N4 ; Au nanoparticles ; GISAXS ; electrical resistivity ; surface plasmon resonance

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Podaci o izdanju

12 (10)

2022.

1361

13

objavljeno

2073-4352

10.3390/cryst12101361

Povezanost rada

Fizika, Interdisciplinarne prirodne znanosti, Interdisciplinarne tehničke znanosti

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