engleski

Application of ICP-OES and ICP-MS in materials analyis

Characterization of historical and modern samples is very important in materials engineering. In historical samples, valuable cultural heritage needs preservation and the obtained results dictate decisions on cleaning, conservation and restoration steps. In contrast, modern newly functionalized polymers with nanoparticles on their surface will have future application depending on the results of precise information on the sample's chemical composition. In both cases the samples are very precious or expensive, rare and usually available for the analysis in very small amounts. In such cases particularly sensitive methodologies like ICP-OES and ICP-MS can provide the vital information on the sample composition. Moreover, their coupling to SEM-EDX, FTIR and other methodologies are unavoidable routine in analytical laboratories [1, 2]. Methods applied should be non-destructive and sensitive enough to detect trace elements in small sample amounts. The goal of this research was to present procedures for fast and simple determination of specific elements of interest in historical and modern materials by ICP-OES, SEM-EDX and ICP-MS. For quality insurance reasons, a comparative method applied for chemical analysis was AAS. Although ICP-OES, ICP-MS and AAS were destructive methods which demanded dissolving of samples prior the analysis, their combination was very useful in analysis of historical and modern samples. SEM-EDS was a simple and non-destructive method which provided information on chemical composition of sample surfaces, morphology and topology, while ICP-OES, ICP-MS and AAS enabled the full insight into their average chemical composition [3].

ICP-OES AND ICP-MS IN MATERIALS ANALYIS

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