Nalazite se na CroRIS probnoj okolini. Ovdje evidentirani podaci neće biti pohranjeni u Informacijskom sustavu znanosti RH. Ako je ovo greška, CroRIS produkcijskoj okolini moguće je pristupi putem poveznice www.croris.hr
izvor podataka: crosbi

Comparison of poled glass SIMS data with concentration profile simulations and and corresponding refractive index (CROSBI ID 723137)

Prilog sa skupa u zborniku | sažetak izlaganja sa skupa | međunarodna recenzija

Pervan, Petar ; Sancho-Parramon, Jordi ; Okorn, Boris ; Janicki, Vesna Comparison of poled glass SIMS data with concentration profile simulations and and corresponding refractive index // Sixth International Symposium on Dielectric Materials and Applications(ISyDMA´6) : Book of Abstracts. Calais, 2021. str. 100-100

Podaci o odgovornosti

Pervan, Petar ; Sancho-Parramon, Jordi ; Okorn, Boris ; Janicki, Vesna

engleski

Comparison of poled glass SIMS data with concentration profile simulations and and corresponding refractive index

Various glass samples were poled using high temperature and electric field. Optical characterization and SIMS of samples were performed. SIMS measurements were compared to numerical simulations of atomic ratio depth profiles.

glass poling

nije evidentirano

nije evidentirano

nije evidentirano

nije evidentirano

nije evidentirano

nije evidentirano

Podaci o prilogu

100-100.

2021.

objavljeno

Podaci o matičnoj publikaciji

Sixth International Symposium on Dielectric Materials and Applications(ISyDMA´6) : Book of Abstracts

Calais:

Podaci o skupu

6th International Symposium on Dielectric Materials and Applications (ISyDMA´6)

poster

15.12.2021-17.12.2021

Calais, Francuska

Povezanost rada

Fizika