engleski

The influence of filtering on surface topography parameters obtained by the AFM

Surface topography is a three-dimensional appearance of a surface that gives a quantitative view of the state of the surface. Surface topography, as one of the main indicators of surface quality, plays a key role in determining the mechanical and tribological properties of products. Parametric topographies, which numerically describe the state of the surface, can be divided into two basic groups: profile (2D) and areal (3D) topography parameters. Areal topography parameters are obtained by measuring samples with an atomic force microscope (AFM). The measurement result obtained using an atomic force microscope is an image in a 2D or 3D format with associated areal topography parameters. The image as a measurement result requires further processing in the image analysis software. Different filters are often used to remove artefacts, noise, or other features. In this paper, the influence of different image processing filters on surface topography parameters are described.

surface topography ; areal topography parameters ; atomic force microscope

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