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Pregled bibliografske jedinice broj: 1123201

Investigation of Ion Irradiation Effects in Silicon and Graphite Produced by 23 MeV I Beam


Tomić Luketić, Kristina; Karlušić, Marko; Gajović, Andreja; Fazinić, Stjepko; Pielić, Borna; Radatović, Borna; Kralj, Marko
Investigation of Ion Irradiation Effects in Silicon and Graphite Produced by 23 MeV I Beam // Materials, 14 (2021), 8; 1904, 13 doi:10.3390/ma14081904 (međunarodna recenzija, članak, znanstveni)


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Naslov
Investigation of Ion Irradiation Effects in Silicon and Graphite Produced by 23 MeV I Beam

Autori
Tomić Luketić, Kristina ; Karlušić, Marko ; Gajović, Andreja ; Fazinić, Stjepko ; Pielić, Borna ; Radatović, Borna ; Kralj, Marko

Izvornik
Materials (1996-1944) 14 (2021), 8; 1904, 13

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
swift heavy ion ; ion track ; RBS/c ; AFM ; TEM ; Raman spectroscopy ; silicon ; graphite

Sažetak
Both silicon and graphite are radiation hard materials with respect to swift heavy ions like fission fragments and cosmic rays. Recrystallisation is considered to be the main mechanism of prompt damage anneal in these two materials, resulting in negligible amounts of damage produced, even when exposed to high ion fluences. In this work we present evidence that these two materials could be susceptible to swift heavy ion irradiation effects even at low energies. In the case of silicon, ion channeling and electron microscopy measurements reveal significant recovery of pre-existing defects when exposed to a swift heavy ion beam. In the case of graphite, by using ion channeling, Raman spectroscopy and atomic force microscopy, we found that the surface of the material is more prone to irradiation damage than the bulk.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA


Projekti:
HRZZ-IP-2018-01-2786 - Dinamika defekta u nanomaterijalima: istraživanje putem eksperimenata s ionskim tragovima (DyNaMITE++) (Karlušić, Marko, HRZZ - 2018-01) ( POIROT)
EK-EFRR-KK.01.1.1.01.0001 - Potpora vrhunskim istraživanjima Centra izvrsnosti za napredne materijale i senzore (Ivanda, Mile; Jakšić, Milko; Stipčević, Mario; Kralj, Marko, EK - KK.01.1.1.01) ( POIROT)

Ustanove:
Institut za fiziku, Zagreb,
Institut "Ruđer Bošković", Zagreb

Citiraj ovu publikaciju

Tomić Luketić, Kristina; Karlušić, Marko; Gajović, Andreja; Fazinić, Stjepko; Pielić, Borna; Radatović, Borna; Kralj, Marko
Investigation of Ion Irradiation Effects in Silicon and Graphite Produced by 23 MeV I Beam // Materials, 14 (2021), 8; 1904, 13 doi:10.3390/ma14081904 (međunarodna recenzija, članak, znanstveni)
Tomić Luketić, K., Karlušić, M., Gajović, A., Fazinić, S., Pielić, B., Radatović, B. & Kralj, M. (2021) Investigation of Ion Irradiation Effects in Silicon and Graphite Produced by 23 MeV I Beam. Materials, 14 (8), 1904, 13 doi:10.3390/ma14081904.
@article{article, year = {2021}, pages = {13}, DOI = {10.3390/ma14081904}, chapter = {1904}, keywords = {swift heavy ion, ion track, RBS/c, AFM, TEM, Raman spectroscopy, silicon, graphite}, journal = {Materials}, doi = {10.3390/ma14081904}, volume = {14}, number = {8}, issn = {1996-1944}, title = {Investigation of Ion Irradiation Effects in Silicon and Graphite Produced by 23 MeV I Beam}, keyword = {swift heavy ion, ion track, RBS/c, AFM, TEM, Raman spectroscopy, silicon, graphite}, chapternumber = {1904} }
@article{article, year = {2021}, pages = {13}, DOI = {10.3390/ma14081904}, chapter = {1904}, keywords = {swift heavy ion, ion track, RBS/c, AFM, TEM, Raman spectroscopy, silicon, graphite}, journal = {Materials}, doi = {10.3390/ma14081904}, volume = {14}, number = {8}, issn = {1996-1944}, title = {Investigation of Ion Irradiation Effects in Silicon and Graphite Produced by 23 MeV I Beam}, keyword = {swift heavy ion, ion track, RBS/c, AFM, TEM, Raman spectroscopy, silicon, graphite}, chapternumber = {1904} }

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus


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