Simultaneous GISAXS/GIXD measurements of nanostructures in ZnO thin films (CROSBI ID 697518)
Prilog sa skupa u zborniku | sažetak izlaganja sa skupa | međunarodna recenzija
Podaci o odgovornosti
Lučić Lavčević, Magdy ; Bernstorff, Sigrid ; Dubček, Pavo ; Šilović, Lucija
hrvatski
Simultaneous GISAXS/GIXD measurements of nanostructures in ZnO thin films
ZnO nanostructures were prepared by several combined physical and chemical methods and by variation of preparation conditions. The specific details of their morphology was analyzed by simultaneous GISAXS/GIXD measurements.
ZnO, nanostructures, GISAXS, GIXD
nije evidentirano
engleski
Simultaneous GISAXS/GIXD measurements of nanostructures in ZnO thin films
nije evidentirano
ZnO, nanostructures, GISAXS, GIXD
nije evidentirano
Podaci o prilogu
172
2012.
objavljeno
Podaci o matičnoj publikaciji
Radić, Nikola ; Milošević, Slobodan
Zagreb: Hrvatsko Vakuumsko Društvo (HVD)
9789539815415
Podaci o skupu
14th Joint Vacuum Conference - 12th European Vacuum Conference - 11th Annual Meeting of the German Vacuum Society - 19th Croatian-Slovenian Vacuum Meeting
poster
04.06.2012-08.06.2012
Dubrovnik, Hrvatska