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TOF SIMS in the organic material analysis applications in cultural heritage, biology and forensics

The MeV Time-of-Flight Secondary Ion Mass Spectrometry (MeV TOF-SIMS) technique is based on a concept being developed already in 1974 when the first papers on desorption of molecular ions using fission fragments from 252Cf source (plasma desorption mass spectrometry - PDMS) appeared. It has been demonstrated that several orders of magnitude larger yields, as well as less fragmentation, are expected for larger molecular masses when MeV ions are used for excitation, which is especially important for imaging of organic samples with a micrometer lateral resolution. In 2012, the MeV TOF- SIMS setup is constructed and installed at Ruđer Bošković Institute Heavy Ion Microbeam Facility in Zagreb. Due to the technique potential to analyse high-masses with high-sensitivity, and the fact that it is surface sensitive, MeV TOF-SIMS was employed for the analysis of the various organic samples from the cultural heritage, biology, and forensics. MeV TOF-SIMS setup was successfully applied for the cultural heritage studies, namely for the analysis of the modern paint materials and for distinguishing between different forms of pigments and binders with molecular masses in the range from 1 - 1200 Da. Capabilities of the MeV TOF-SIMS technique were also demonstrated by measuring chemical composition (2D lipids distributions) inside the individual CaCo-2 cells as well as withing the mouse liver and brain tissue. Recently, MeV TOF-SIMS in combination with Particle Induced X-ray Emission (PIXE) was applied to determine the deposition order of the different writing tools for forensic document examination. In addition, the latest results on the applications of the new MeV TOF-SIMS setup, with glass capillary for the ion beam focusing, will be presented.

MeV TOF-SIMS ; organic samples ; cultural heritage ; biological samples ; forensics ; glass capillary ; ion beam focusing

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