An Approach to the Determination of the Reliability of Semiconductor Memory Systems (CROSBI ID 695116)
Prilog sa skupa u zborniku | sažetak izlaganja sa skupa | međunarodna recenzija
Podaci o odgovornosti
Nožica, Žarko
engleski
An Approach to the Determination of the Reliability of Semiconductor Memory Systems
Abstract: The approach for the increase and determination of the memory system reliability is presented. The paper starts with the development of the reliability model of the basic memory array. It is upgraded to the models suitable for the analysls of more complex systems imploying techniques such as hardware redundancies, error correcting codes, software error correcting algorithms. The models incorporate also the effects of faults masked by data. The developed models are particularly useful for the estimation of the semiconductor memories reliability. The results suggest that the erasure correction method render the optimal reliability.
Reliability, Memory, Modeling,
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Podaci o prilogu
40-44.
1985.
objavljeno
Podaci o matičnoj publikaciji
Podaci o skupu
Mikrosystem '85
predavanje
28.10.1985-31.10.1985
Tábor, Češka Republika