engleski

Miniature high resolution X-ray spectrometer for ion microprobe

Particle induced X-ray emission (PIXE) technique is a routine, non-destructive analytical tool for sensitive determination of elemental composition in samples irradiated with MeV energy protons. In analysis of associated PIXE spectra, recorded with energy dispersive spectrometers like Si(Li), Ge and/or SDD detectors, small variations of X-ray intensity ratios or energies due to chemical effects are usually ignored although their small influence could be detected [1]. Recently we employed simple high energy resolution crystal X-ray spectrometer to study chemical effects on broad beam PIXE induced Kβ X-ray spectra of 3d transition element compounds [2, 3, 4, 5]. Based on the experience gained with broad beams, we designed and constructed downsized wavelength dispersive X-ray (WDX) spectrometer for application on microscopic samples utilizing micrometer beam size available at our ion microprobe. During the design stage an X-ray tracing program XTRACE was used to check the usability of a simple flat crystal as dispersive element and to optimize the spectrometer geometry [6, 7]. Charge coupled device (CCD) X-ray detector with good spatial resolution, simple flat crystal and sample holder are enclosed in specifically designed vacuum chamber installed behind the main ion microprobe chamber. In this work we will give detailed description of the developed system, discuss its advantages and limitations, present ongoing development of image processing procedure yielding transfer of X-ray images to energy dispersive spectra, and show examples of collected spectra from various samples. [1] S. Fazinić, I. Božičević Mihalić, L. Mandić, J. Anal. At. Spectrom. 28 (2013) 1725 [2] S. Fazinić, M. Jakšić, L. Mandić, J. Dobrinić, Phys. Rev. A 74 (2006) 062501 [3] L. Mandić, S. Fazinić, M. Jakšić, Phys. Rev. A 80 (2009) 042519. [4] S. Fazinić, L. Mandić, M. Kavčič, I. Božičević, J. Anal. At. Spectrom. 26 (2011) 2467 [5] S. Fazinić, L. Mandić, M. Kavčič, I. Božičević, Spectrochim. Acta, Part B 66 (2011) 461-469. [6] T. Tadić, M. Jakšić, I. Božičević, X ray Spectrom. 38 (2009) 222 [7] T. Tadić, M. Jakšić, I. Božičević, X ray Spectrom. 40 (2011) 147

High Resolution X-Ray Spectroscopy ; WDX ; PIXE

nije evidentirano