izvor podataka: crosbi
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PIXE depth profiling (CROSBI ID 273269)
Prilog u časopisu | izvorni znanstveni rad | međunarodna recenzija
Jakšić, Milko ; Vajić, Mirjana ; Fazinić, Stjepko ; Tadić, Tonči ; Valković, Vladivoj
PIXE depth profiling // Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 40-41 (1989), 643-645. doi: 10.1016/0168-583X(89)91066-5
Podaci o odgovornosti
Jakšić, Milko ; Vajić, Mirjana ; Fazinić, Stjepko ; Tadić, Tonči ; Valković, Vladivoj
engleski
PIXE depth profiling
PIXE measurements done with different proton energies provide results from which concentration depth profiles can be extracted. An aluminium sample with known concentration depth profile of zinc was analysed. The results presented show the usefulness of the method.
PIXE ; depth profiling
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Podaci o izdanju
40-41
1989.
643-645
objavljeno
0168-583X
1872-9584
10.1016/0168-583X(89)91066-5
Povezanost rada
Povezane osobe
Povezane ustanove
