izvor podataka: crosbi
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15th International Conference on Particle Induced X-ray Emission ("PIXE2017") (CROSBI ID 272770)
Prilog u časopisu | uvodnik | međunarodna recenzija
Fazinić, Stjepko ; Orlić, Ivica ; Tadić, Tonči
15th International Conference on Particle Induced X-ray Emission ("PIXE2017") // Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 417 (2018), 1-14. doi: 10.1016/j.nimb.2017.12.017
Podaci o odgovornosti
Fazinić, Stjepko ; Orlić, Ivica ; Tadić, Tonči
engleski
15th International Conference on Particle Induced X-ray Emission ("PIXE2017")
Uvodnik posebnog broja časopisa Nuclear Instruments and Methods Section B posvećen 15. međunarodnoj konferenciji o česticama induciranom X-zračenju, održanoj u Splitu u travnju 2017. godine.
PIXE2017
nije evidentirano
nije evidentirano
nije evidentirano
nije evidentirano
nije evidentirano
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Podaci o izdanju
417
2018.
1-14
objavljeno
0168-583X
1872-9584
10.1016/j.nimb.2017.12.017
