engleski

Temperature effects in X-ray computed tomography

The aim of this research is to measure the time dependent temperature distribution and thermal time constant within a typical industrial X-ray computed tomography (XCT) system used for dimensional metrology. Temperature effects can significantly affect measurement results of XCT scans either by directly changing the dimensions of the measurement object, or indirectly by changing the geometry of XCT scanner. In either case, the effect is not known well enough to be used for correction of measurement results or estimation of measurement uncertainty. In order to determine these effects, traceable temperature measurements are performed during various stages of operation with a custom measurement system designed for this application. The influence of temperature fluctuations on length errors are determined by correlation of the measured temperature fluctuations with measurement deviations of a reference standard in repeated CT scans at different X-ray power levels.

Length metrology, computed tomography, traceability, temperature measurement

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