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Pregled bibliografske jedinice broj: 1005054

Assessment of Mental Fatigue During Examination Period with P300 Oddball Paradigm


Zelenika Zeba, Mirta; Friganović, Krešimir; Palmović, Marijan; Išgum, Velimir; Cifrek, Mario
Assessment of Mental Fatigue During Examination Period with P300 Oddball Paradigm // Proceedings of MIPRO 2019, 42nd International Convention on Information and Communication Technology, Electronics and Microelectronics / Koričić, Marko ; Butković, Zeljko ; Skala, Karolj ; Car, Željka ; Čičin-Šain, Marina ; Babić, Snježana ; Sruk, Vlado ; Škvorc, Dejan ; Ribarić, Slobodan ; Groš, Stjepan ; Vrdoljak, Boris ; Mauher, Mladen ; Tijan, Edvard ; Pale, Predrag ; Huljenić, Darko ; Grbac Galinac, Tihana ; Janjić, Matej (ur.).
Opatija, Hrvatska: IEEE, 2019. str. 1479-1484 doi:10.23919/MIPRO.2019.8756850 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)


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Naslov
Assessment of Mental Fatigue During Examination Period with P300 Oddball Paradigm

Autori
Zelenika Zeba, Mirta ; Friganović, Krešimir ; Palmović, Marijan ; Išgum, Velimir ; Cifrek, Mario

Vrsta, podvrsta i kategorija rada
Radovi u zbornicima skupova, cjeloviti rad (in extenso), znanstveni

Izvornik
Proceedings of MIPRO 2019, 42nd International Convention on Information and Communication Technology, Electronics and Microelectronics / Koričić, Marko ; Butković, Zeljko ; Skala, Karolj ; Car, Željka ; Čičin-Šain, Marina ; Babić, Snježana ; Sruk, Vlado ; Škvorc, Dejan ; Ribarić, Slobodan ; Groš, Stjepan ; Vrdoljak, Boris ; Mauher, Mladen ; Tijan, Edvard ; Pale, Predrag ; Huljenić, Darko ; Grbac Galinac, Tihana ; Janjić, Matej - : IEEE, 2019, 1479-1484

ISBN
978-953233098-4

Skup
42nd International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO)

Mjesto i datum
Opatija, Hrvatska, 20-24.05.2019

Vrsta sudjelovanja
Predavanje

Vrsta recenzije
Međunarodna recenzija

Ključne riječi
mental fatigue ; P300, examination period ; EEG ; event related potentials
(mental fatigue ; P300 ; examination period ; EEG ; event related potentials)

Sažetak
Mental fatigue refers to the effects that people experience during and following prolonged periods of cognitive activity that requires work efficiency. Undergraduate students are faced with increased cognitive demands during the examination period that can lead to a higher level of perceived mental fatigue. The P300 component of the event- related potentials is considered an indicator of cognitive information processing, attention allocation and immediate memory. Variation in the P300 component has been linked to a fluctuation in natural and environmentally induced states. In order to evaluate the effects of sleepiness and the mental fatigue we used visual discrimination task to evoke the P300 potential. Reaction time (RT) to deviant stimuli and number of errors were also recorded. Several features of P300 evoked related potential, such as maximum and minimum amplitude, and latency were extracted to evaluate subject’s performance in two sessions: during rested period and tired period. Subjects were placed into two sessions based on the battery of tests aimed to assess their arousal state. Rested state was recorded when subjects did not have any increased mental assignments. Tired state was recorded during their increased mental work overload during exam period. Results show a significantly smaller mean amplitude (p < 0.05) and slower RTs in a tired state.

Izvorni jezik
Engleski

Znanstvena područja
Kognitivna znanost (prirodne, tehničke, biomedicina i zdravstvo, društvene i humanističke znanosti)



POVEZANOST RADA


Ustanove:
Edukacijsko-rehabilitacijski fakultet, Zagreb,
Fakultet elektrotehnike i računarstva, Zagreb,
Sveučilište u Zagrebu

Citiraj ovu publikaciju

Zelenika Zeba, Mirta; Friganović, Krešimir; Palmović, Marijan; Išgum, Velimir; Cifrek, Mario
Assessment of Mental Fatigue During Examination Period with P300 Oddball Paradigm // Proceedings of MIPRO 2019, 42nd International Convention on Information and Communication Technology, Electronics and Microelectronics / Koričić, Marko ; Butković, Zeljko ; Skala, Karolj ; Car, Željka ; Čičin-Šain, Marina ; Babić, Snježana ; Sruk, Vlado ; Škvorc, Dejan ; Ribarić, Slobodan ; Groš, Stjepan ; Vrdoljak, Boris ; Mauher, Mladen ; Tijan, Edvard ; Pale, Predrag ; Huljenić, Darko ; Grbac Galinac, Tihana ; Janjić, Matej (ur.).
Opatija, Hrvatska: IEEE, 2019. str. 1479-1484 doi:10.23919/MIPRO.2019.8756850 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)
Zelenika Zeba, M., Friganović, K., Palmović, M., Išgum, V. & Cifrek, M. (2019) Assessment of Mental Fatigue During Examination Period with P300 Oddball Paradigm. U: Koričić, M., Butković, Z., Skala, K., Car, Ž., Čičin-Šain, M., Babić, S., Sruk, V., Škvorc, D., Ribarić, S., Groš, S., Vrdoljak, B., Mauher, M., Tijan, E., Pale, P., Huljenić, D., Grbac Galinac, T. & Janjić, M. (ur.)Proceedings of MIPRO 2019, 42nd International Convention on Information and Communication Technology, Electronics and Microelectronics doi:10.23919/MIPRO.2019.8756850.
@article{article, year = {2019}, pages = {1479-1484}, DOI = {10.23919/MIPRO.2019.8756850}, keywords = {mental fatigue, P300, examination period, EEG, event related potentials}, doi = {10.23919/MIPRO.2019.8756850}, isbn = {978-953233098-4}, title = {Assessment of Mental Fatigue During Examination Period with P300 Oddball Paradigm}, keyword = {mental fatigue, P300, examination period, EEG, event related potentials}, publisher = {IEEE}, publisherplace = {Opatija, Hrvatska} }
@article{article, year = {2019}, pages = {1479-1484}, DOI = {10.23919/MIPRO.2019.8756850}, keywords = {mental fatigue, P300, examination period, EEG, event related potentials}, doi = {10.23919/MIPRO.2019.8756850}, isbn = {978-953233098-4}, title = {Assessment of Mental Fatigue During Examination Period with P300 Oddball Paradigm}, keyword = {mental fatigue, P300, examination period, EEG, event related potentials}, publisher = {IEEE}, publisherplace = {Opatija, Hrvatska} }

Časopis indeksira:


  • Web of Science Core Collection (WoSCC)
    • Conference Proceedings Citation Index - Science (CPCI-S)
  • Scopus


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